Wafer Appearance Inspection Device (Model MWL-02)
This machine is a device that performs macro and micro inspections of φ8-inch wafers in the semiconductor manufacturing process.
In macro inspection, the wafer angle can be freely adjusted using joystick operation. Additionally, in micro inspection through microscope observation, it is possible to switch between viewing through the eyepiece and the monitor. Two wafer cassettes can be mounted.
- Company：ジャステム
- Price：Other
